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Samaradasa Weerahandi

dblp:96/4854 · DBLP profile ↗
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1ranked-venue papers
1as first author
0since 2021 · last 1994
—ORCID · unresolved

Domains — the database's venue-derived domains; a paper can count in several

Software engineering, systems software and programming languages · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Software engineering, system software, and programming languages
1 paper
Empirical software engineering · 77% Software maintenance and evolution · 23%

Topics — the 2 heaviest of 2, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Empirical software engineering › software metrics
software quality metrics
0.011994
Software Quality Measurement Based on Fault-Detection Data · IEEE Trans. Software Eng. 1994
Software maintenance and evolution › software configuration management › software release management
software release
0.011994
Software Quality Measurement Based on Fault-Detection Data · IEEE Trans. Software Eng. 1994

Methods — techniques the papers use, named apart from their topics

weibull distribution · 0.0statistical modeling · 0.0pareto distribution · 0.0
YearPublicationVenuePosition
1994 Software Quality Measurement Based on Fault-Detection Data
abstract
We develop a methodology to measure the quality levels of a number of releases of a software product in its evolution process. The proposed quality measurement plan is based on the faults detected in field operation of the software. We describe how fault discovery data can be analyzed and reported in a framework very similar to that of the QMP (quality measurement plan) proposed by B. Hoadley (1986). The proposed procedure is especially useful in situations where one has only very little data from the latest release. We present details of implementation of solutions to a class of models on the distribution of fault detection times. The conditions under which the families: exponential, Weibull, or Pareto distributions might be appropriate for fault detection times are discussed. In a variety of typical data sets that we investigated one of these families was found to provide a good fit for the data. The proposed methodology is illustrated with an example involving three releases of a software product, where the fault detection times are exponentially distributed. Another example for a situation where the exponential fit is not good enough is also considered.>
Samaradasa Weerahandi, Robert E. Hausman
IEEE Trans. Software Eng.1