Demo Data from EDBT 2026 / reviewers in the wild / expert
Zhaohui Zheng 0002
dblp:97/3461-2
· DBLP profile ↗
4ranked-venue papers
2as first author
4since 2021 · last 2022
0000-0002-7303-4856ORCID · conflict
Domains — the database's venue-derived domains; a paper can count in several
Artificial intelligence and machine learning · 2 · 1 first-author · 2 since 2021Security and privacy · 1 · 1 first-author · 1 since 2021Graphics, computer vision, multimedia, augmented reality and games · 1 · 1 since 2021
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer graphics and multimedia
1 paper |
Image and video processing · 100% | |
| Network and information security
1 paper |
Hardware security and side channels · 100% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Image and video processing › feature extraction
feature descriptor |
0.6 | 1 | 2022 | Circumferential Local Ternary Pattern: New and Efficient Feature Descriptors for Anti-Counterfeiting Pattern Identification · IEEE Trans. Inf. Forensics Secur. 2022 |
Image and video processing
texture analysis |
0.6 | 1 | 2022 | Circumferential Local Ternary Pattern: New and Efficient Feature Descriptors for Anti-Counterfeiting Pattern Identification · IEEE Trans. Inf. Forensics Secur. 2022 |
Image and video processing › texture analysis
texture descriptor |
0.6 | 1 | 2022 | Circumferential Local Ternary Pattern: New and Efficient Feature Descriptors for Anti-Counterfeiting Pattern Identification · IEEE Trans. Inf. Forensics Secur. 2022 |
Hardware security and side channels › intellectual property protection
anti-counterfeiting |
0.2 | 1 | 2022 | Circumferential Local Ternary Pattern: New and Efficient Feature Descriptors for Anti-Counterfeiting Pattern Identification · IEEE Trans. Inf. Forensics Secur. 2022 |
Methods — techniques the papers use, named apart from their topics
local ternary pattern · 1.1local binary pattern · 1.1feature histograms · 0.6feature histogram · 0.6
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2022 | Classification of jujube defects in small data sets based on transfer learningabstractAbstract Although convolutional neural networks have achieved success in the field of image classification, there are still challenges in the field of agricultural product quality sorting such as machine vision-based jujube defects detection. The performance of jujube defect detection mainly depends on the feature extraction and the classifier used. Due to the diversity of the jujube materials and the variability of the testing environment, the traditional method of manually extracting the features often fails to meet the requirements of practical application. In this paper, a jujube sorting model in small data sets based on convolutional neural network and transfer learning is proposed to meet the actual demand of jujube defects detection. Firstly, the original images collected from the actual jujube sorting production line were pre-processed, and the data were augmented to establish a data set of five categories of jujube defects. The original CNN model is then improved by embedding the SE module and using the triplet loss function and the center loss function to replace the softmax loss function. Finally, the depth pre-training model on the ImageNet image data set was used to conduct training on the jujube defects data set, so that the parameters of the pre-training model could fit the parameter distribution of the jujube defects image, and the parameter distribution was transferred to the jujube defects data set to complete the transfer of the model and realize the detection and classification of the jujube defects. The classification results are visualized by heatmap through the analysis of classification accuracy and confusion matrix compared with the comparison models. The experimental results show that the SE-ResNet50-CL model optimizes the fine-grained classification problem of jujube defect recognition, and the test accuracy reaches 94.15%. The model has good stability and high recognition accuracy in complex environments. Jianping Ju, Xiaohang Xu 0003, Zhaohui Zheng 0002, Mingyu Lin |
Neural Comput. Appl. | 5 |
| 2022 | Circumferential Local Ternary Pattern: New and Efficient Feature Descriptors for Anti-Counterfeiting Pattern IdentificationabstractAn important aspect of querying whether a product is likely to be forged is to identify its anti-counterfeiting label. However, the use of image processing technology for label-specific texture analysis to quickly and effectively identify the anti-counterfeiting label has been widely studied. Aiming at the defects of the local binary pattern (LBP) and its variants in texture identification, this paper proposes a new texture model for anti-counterfeiting identification, that is, the circular local ternary pattern (CLTP). The highlight of our technology is that it extracts the effective local texture descriptors by using the random features of inkjet printing. This allows for the technology to not only resist the interference of noise and illumination in images of anti-counterfeiting patterns but also to encode and reorganize the fine linear shape structure. Specifically, this paper extracts the CLTP texture feature in the corresponding key areas and forms the final feature histogram vector for comparison through the one-to-one correspondence between the sample image and the inspected image of anti-counterfeiting pattern. Experiments prove that our method not only has high discrimination, stability and effectiveness but also provides a convenient and practical idea for anti-counterfeiting technology. Zhaohui Zheng 0002, Bichao Xu, Jianping Ju, Changhui You, Qiang Lei |
IEEE Trans. Inf. Forensics Secur. | 1 |
| 2022 | LiteCortexNet: toward efficient object detection at night
Sikai Wang, Deng Chen, Yanduo Zhang, Wei Liu 0060, Zhaohui Zheng 0002 |
Vis. Comput. | 7 |
| 2021 | A system for identifying an anti-counterfeiting pattern based on the statistical difference in key image regions
Zhaohui Zheng 0002, Jianping Ju, Deng Chen, Changhui You, Mingyu Lin |
Expert Syst. Appl. | 1 |