FPGA designs are typically optimized for speed and accuracy, with the amount of available hardware considered after the fact. Balancing speed, accuracy, and hardware utilization is a difficult proposition. In this paper, we demonstrate the Hardware Optimization Tool for Memory Table and Logic Conversion (HOTMeTaL) which helps with this tradeoff by modifying part or the majority of an existing FPGA design to use additional logic resources when memory is at a premium, or force the use of memory when logic is highly utilized; without significantly changing the overall functionality of the design. Using established minimization methods, traditionally used for programmable logic devices (PLDs), we also allow the conversion of groups or individual output bits into minimal logic circuits, which then allows the creation of several functionally identical designs, but allowing more control over the resources used in a design. After introducing the basics of the algorithm, we demonstrate the utility of this process with direct comparisons to examples from previous works. It is demonstrated that in some cases, our system will reduce the amount of logic (slices) while simultaneously removing the

Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shipped to the customers fault-free. However, at-speed tests have been known to create higher-than-average switching activity, which normally is not accounted for in the design of the power supply network. This potentially creates conditions for additional delay in the chip; causing it to fail during test. In this paper, we propose a pattern compaction technique that considers the layout and gate distribution when generating transition delay fault patterns. The technique focuses on evenly distributing switching activity generated by the patterns across the layout rather than allowing high switching activity to occur in a small area in the chip that could occur with conventional delay fault pattern generation. Due to the relationship between switching activity and IR-drop, the reduction of switching will prevent large IR-drop in high demand regions while still allowing a suitable amount of switching to occur elsewhere on the chip to prevent fault coverage loss. This even distribution of switching on the chip will also result in avoiding hot-spots.