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Alfred J. Lamperez

dblp:97/6122 · DBLP profile ↗
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2ranked-venue papers
1as first author
0since 2021 · last 1994
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Computer networks · 2 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Software engineering, system software, and programming languages
2 papers
Software testing · 60% Empirical software engineering · 24% Software maintenance and evolution · 16%

Topics — the 5 heaviest of 6, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Software testing
statistical testing
0.011994
Software testing and sequential sampling · IEEE J. Sel. Areas Commun. 1994
Software testing › test process
test process management
0.011994
Software testing and sequential sampling · IEEE J. Sel. Areas Commun. 1994
Software maintenance and evolution
software inspection
0.011990
Statistical Quality Control Applied to Code Inspections · IEEE J. Sel. Areas Commun. 1990
Empirical software engineering
software metrics
0.011990
Statistical Quality Control Applied to Code Inspections · IEEE J. Sel. Areas Commun. 1990
Empirical software engineering › software metrics
software quality metrics
0.011994
Software testing and sequential sampling · IEEE J. Sel. Areas Commun. 1994

Methods — techniques the papers use, named apart from their topics

statistical confidence analysis · 0.0sequential sampling plans · 0.0statistical quality control · 0.0control charts · 0.0
YearPublicationVenuePosition
1994 Software testing and sequential sampling
abstract
The paper briefly describes sequential sampling and explains how such sampling procedures can be integrated into a software testing strategy to provide benefit. Using first-pass failure rate, (a simple software testing metric), as a quality indicator, the authors show theoretically and empirically how sequential sampling plans can be used to establish a mechanism with known statistical confidence/risk which allows for decisions to stop testing when product quality either meets the target or is worse than the expectation. Quality assessment, as well as quality certification roles, can be addressed. When sequential sampling is coupled with other simple statistical techniques, information can also be provided to help identify fault prone areas. Data from releases of the 5ESS Switch project are used in several examples to validate the usefulness of the techniques.>
Alfred J. Lamperez, Steel T. Huang
IEEE J. Sel. Areas Commun.1
1990 Statistical Quality Control Applied to Code Inspections
abstract
Code inspections have been used on the 5ESS switch project since 1983. Beginning with a training program for all the developers involved in the project, code inspections have improved with each new 5ESS switch generic. Variations on a standard SQC (statistical quality control) technique, the control chart, have been used to track the metrics indicative of the effectiveness of code inspections. Parameters used in the computation of these metrics include the preparation effort, inspection time, number of inspectors, the size of the inspected unit of code, and the number of errors found at the inspection. It is noted that the exact form that these control charts have taken has evolved and improved with experience.>
Dennis A. Christenson, Steel T. Huang, Alfred J. Lamperez
IEEE J. Sel. Areas Commun.3