Demo Data from EDBT 2026 / reviewers in the wild / expert
Charles E. McCarthy
dblp:99/1389
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1976
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Hardware reliability and fault tolerance · 75% Distributed systems · 25% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware reliability and fault tolerance › error correction
error-correcting codes |
0.0 | 1 | 1976 | Implementation of an Experimental Fault-Tolerant Memory System · IEEE Trans. Computers 1976 |
Distributed systems › fault tolerance
failure recovery |
0.0 | 1 | 1976 | Implementation of an Experimental Fault-Tolerant Memory System · IEEE Trans. Computers 1976 |
Hardware reliability and fault tolerance
memory fault tolerance |
0.0 | 1 | 1976 | Implementation of an Experimental Fault-Tolerant Memory System · IEEE Trans. Computers 1976 |
Hardware reliability and fault tolerance › error correction › error-correcting codes
SECDED |
0.0 | 1 | 1976 | Implementation of an Experimental Fault-Tolerant Memory System · IEEE Trans. Computers 1976 |
Methods — techniques the papers use, named apart from their topics
self-testing translator/corrector · 0.0fault insertion · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1976 | Implementation of an Experimental Fault-Tolerant Memory SystemabstractThe experimental fault-tolerant memory system described in this paper has been designed to enable the modular addition of spares, to validate the theoretical fault-secure and self-testing properties of the translator/corrector, to provide a basis for experiments using the new testing and correction processes for recovery, and to determine the practicality of such systems. The hardware design and implementation are described, together with methods of fault insertion. The hardware/ software interface, including a restricted single error correction/double error detection (SEC/DED) code, is specified. Procedures are carefully described which, 1) test for specified physical faults, 2) ensure that single error corrections are not miscorrections due to triple faults, and 3) enable recovery from double errors. William C. Carter, Charles E. McCarthy |
IEEE Trans. Computers | 2 |