Text representation is a key performance component for any hypernymy-related task.In this study, we investigate representation techniques to understand which features best represent the hypernymy relation, focusing on three factors of representation: word embedding, embedding combination techniques, and using features.The results indicate that different embeddings have different effects on performance; concatenation, 'addition and subtraction' have led to better performance, and using unsupervised measures has a negative effect on performance.

The testability problem of dual-port memories is investigated. A functional model is defined, and architectural modifications to enhance the testability of such chips are described. These modifications allow multiple access of memory cells for increased test speed with minimal overhead on both silicon area and device performance. New fault models are proposed, and efficient O(/spl radic/n) test algorithms are described for both the memory array and the address decoders. The new fault models account for the simultaneous dual-access property of the device. In addition to the classical static neighborhood pattern-sensitive faults, the array test algorithm covers a new class of pattern sensitive faults, duplex dynamic neighborhood pattern-sensitive faults (DDNPSF).

The testability problem of dual port memories is investigated. Architectural modifications which enhance testability with minimal overhead on both silicon area and device performance are described. New fault models for both the memory array and the address decoders are proposed and efficient O(/spl radic/n) test algorithms are presented. The new fault models account for the simultaneous dual access property of the device. In addition to the classical static neighborhood pattern sensitive faults, the array test algorithm covers a new class of pattern sensitive faults, Duplex Dynamic Neighborhood Pattern Sensitive faults (DDNPSF).